Statistical Analysis of Profile Monitoring

De Rassoul Noorossana, Abbas Saghaei et Amirhossein Amiri

John Wiley & Sons - Collection : Wiley Series in Probability and Statistics - septembre 2011

A paraître

Présentation

This groundbreaking reviews the latest research on the use of control charts to monitor process and product quality profiles. . It is written by experts in the field of statistical process control (such as J. D. Williams of General Electric Global Research, Jeffrey B. Birch at VPI, and Longcheen Huwang of the Institute of Statistics at Tsing Hua University Hsin Chu). The book presents a comprehensive coverage of profiles monitoring definitions, techniques, models, and application examples, especially in various fields of engineering and statistics. It covers state-of-the-art materials and deserves a place among the tools of every quality engineer who works in monitoring and improving statistical processes.